(circuit design) A technique used to increase the
these act like
flip-flops but they can be switched into a
This allows data to be clocked serially through all the scan
registers and out of an output pin at the same time as new
data is clocked in from an input pin.
Using this technique, the state of certain points in the
circuit can be examined and modified at any time by suspending
normal operation and switching to test mode. If the scan path
is placed adjacent to the circuit's input and output pins then
(1995-02-14)